Sem/edx services by MicroVision Laboratories near me? The desired chip packages were sectioned from the larger board, and placed in an epoxy mounting cup. The epoxy was mixed and allowed to harden. The resulting epoxy puck was cross sectioned and polished. The epoxy mounting and cross sectioning process gave precise, perfectly preserved cross sectional surfaces through the desired components and their solder bonds.
The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.
Dust samples were analyzed using polarized light microscopy (PLM) to provide percentages of the particle types present in the samples. MVL was able to determine that there was significant loading of glass fibers in the dust samples with the likely source being contractor’s work in the attic which involved disturbing the fiberglass insulation. The image on the right shows a few distinct glass fibers with a binder material adhered to them, consistent with fiberglass insulation.
We are proud to announce that MicroVision Labs is now accredited to the ISO/IEC 17025:2017 standard. This represents over a year of diligent effort from all of our staff to verify and validate our in house SOP’s and transform our quality management system to one that is compliant to this international standard. This certification requires that accredited labs demonstrate that they are competent and can produce technically valid data and results unlike other certifications such as ISO 9001:2015. This represents an obvious value to our clients. Discover even more info on Microvision labs microscopy services.
What is your standard turnaround time (TAT) and can it be expedited? Our standard TAT is 5 to 10 business days. We can provide faster TATs on request with the following surcharges: – Same day to 24 hour rush is 100% surcharge – 2 day rush is 75% surcharge – 3 day rush is 50% surcharge – 4 day rush is 25% surcharge Rush requests must have prior approval otherwise we cannot guarantee turnaround times.
Energy Dispersive X-Ray Spectroscopy (EDS): While in a Scanning Electron Microscope (SEM), samples are exposed to high energy electrons in a vacuum, which generates X-rays through secondary electron transitions. Variations in electron configuration specific to each element generate different energy electrons, and thus different signature energy peaks, indicating which elements are present in the sample. Analysis is performed only on areas which are exposed to the electron beam, facilitating precise control of the analyzed area. This means the composition of very small areas or particles in a sample can be taken. Since EDS is performed in the SEM chamber, a quick and easy interrogation of the surface materials as viewed on the SEM is possible. This can be expanded to include the entire sample, please see our Elemental Mapping page. Additionally, relative amount of the elements present can be calculated, generating composition percentages. Discover a few more info at here.