Microscopy lab laboratories by Microvisionlabs.com? MicroVision Laboratories, Inc. has been providing extensive expertise in micro-analytical techniques (FE-SEM, SEM, EDS, XRF, FTIR testing, PLM, X-Ray Imaging, DIC) and sample preparation since 2003. Our cutting edge, high-performance equipment combined with our solutions-focused customer service provide critical solutions for clients hailing from a broad range of industries ranging from medical to semiconductor, and from environmental to textile.
Close examination of any possible defects or voids was undertaken at higher magnification. The voids did not appear to create any structural or conductivity issues. Additionally, the formation and contiguity of intermetallic bonds between the contacts and solder were shown using a combination of EDS line scan elemental spectroscopy and elemental mapping. The SEM image and the EDS map to the left show the intermetallic layer between the copper wire and the tin/lead solder via the mixture of the red copper and the blue tin. Discover more info at this website.
An affected floor tile was submitted to determine if the previous mold testing had missed a source on the tile backing or mastic. Additionally, a new tile from the same manufacturing lot was submitted for comparison. The process of preparing and examining the sample and reference tile was documented. Areas with darkened surface features were imaged and then cut out and examined. While the dark spots looked very discrete when examined by eye, under top light polarized microscopy they appeared more diffuse at the outer edges. The darkest areas surrounded what appeared to be particles embedded in the surface.
Do you give lab tours? Yes, we routinely give lab tours to our clients and potential clients. Please call and we would be happy to schedule a tour for you and your co-workers. Do you have other locations around the country? We do work for companies all across the United States, with one laboratory which is located in Chelmsford, Massachusetts. Did MicroVision Labs ever operate under a different company name? No, we have always been MicroVision Laboratories, Inc. Our founder, John Knowles, used to work for another laboratory that underwent several name changes (Eastern Analytical Laboratories, Industrial Environmental Analysts, American Environmental Network, Severn Trent Laboratories, and EMLab P&K Billeria) and was located nearby in Billerica. When that laboratory was closed in 2008, John hired a few of the remaining analysts and acquired its equipment, client list and phone number.
SEM is a powerful surface microscopy method which allows for high resolution images to be obtained on a wide range of samples. A focused beam of electrons sweeps across a sample surface and an image is created from the scattered electrons. The electron beam allows for the accurate imaging of features below the resolution limit of visible light. The acquired pictures retain good depth of field, resulting in excellent three-dimensional images. Variations in beam parameters can be made in order to highlight variations in density in the target sample, show extremely fine surface features, and illustrate texture in sample surface coatings. MicroVision Labs has multiple fully-operational SEMs, Bruker X-Flash EDS detectors and mapping technology, backscatter electron (BSE) imaging, and large chamber capabilities. These provide a full suite of microscopy services for all of your analytical needs. Find extra details on https://microvisionlabs.com/.
Analysis and Results: The submitted bottle was examined for signs of interior distress, and the water from the bottle was removed and maintained. Some of the suspended particulate was filtered and examined non-destructively by light microscopy first, to characterize the material. A low magnification stereo microscope image of the filtered white particulate is shown in the image above. From this image, biological tissues were ruled out, and the material was observed to be crystalline. Polarized light microscopy (PLM) was used to analyze the sample next. From this examination, the material showed birefringence as shown in the PLM image on the right. The PLM Image Stereo Microscope image suspect material showed optical properties and morphology dissimilar to common carbonates and sulfates. It was determined to be a birefringent crystalline material, but it could not be identified using only PLM methods. Therefore, analysis using scanning electron microscopy with energy dispersive x-ray spectroscopy (SEM-EDS) would have to be performed to obtain further information about the suspect material.