Particle size analysis company in the USA in 2021? As indicated in the FTIR spectral comparison below, the suspect material showed a near perfect match for acetylsalicylic acid. Additionally, there was a small amount of dibasic phosphate present. It was determined that the material was likely acetylsalicylic acid with a phosphate binder – an aspirin. Therefore, from this analysis the suspect material in the bottle was likely a household aspirin tablet, broken apart and separated by the water. In order to confirm the identification, a few aspirin tablets from several common manufacturers were obtained, roughly ground, and soaked to allow for comparison. The optical morphology of the crystals, size range of the particles, association with the phosphate and FTIR spectrum all were consistent with the original suspect material. A report detailing the methods and findings in full narrative form was rendered to the client.
SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects.
What is your standard turnaround time (TAT) and can it be expedited? Our standard TAT is 5 to 10 business days. We can provide faster TATs on request with the following surcharges: – Same day to 24 hour rush is 100% surcharge – 2 day rush is 75% surcharge – 3 day rush is 50% surcharge – 4 day rush is 25% surcharge Rush requests must have prior approval otherwise we cannot guarantee turnaround times. Read additional details at look here. MicroVision Laboratories, Inc. has been providing businesses, consultants and other testing laboratories with expert microscopy and analytical services since 2003. Our client base covers a broad spectrum of industries including semi-conductors, aerospace, electronics, biomedical, ceramics, optics, pharmaceuticals, mineralogy, metallurgy, thin films, environmental, membranes filtration and industrial hygiene.
Dust samples were analyzed using polarized light microscopy (PLM) to provide percentages of the particle types present in the samples. MVL was able to determine that there was significant loading of glass fibers in the dust samples with the likely source being contractor’s work in the attic which involved disturbing the fiberglass insulation. The image on the right shows a few distinct glass fibers with a binder material adhered to them, consistent with fiberglass insulation.
Close examination of any possible defects or voids was undertaken at higher magnification. The voids did not appear to create any structural or conductivity issues. Additionally, the formation and contiguity of intermetallic bonds between the contacts and solder were shown using a combination of EDS line scan elemental spectroscopy and elemental mapping. The SEM image and the EDS map to the left show the intermetallic layer between the copper wire and the tin/lead solder via the mixture of the red copper and the blue tin. Discover even more details on this website.